Acquiring and/or logging high speed data, using the traditional DAQmx scaling approach, will consume considerable amounts of memory due to its use of the double precision data type. Each sample collected will consume eight bytes of memory whether being stored in memory or on disk. This size is fine when collecting data at lower rates, but if you are collecting data at a rate of 1 MS/s, eight bytes per sample is too much for most systems to handle.
A customer has been receiving field failures and the root cause has been difficult to determine. They have ideas of what may be causing these failures and need a test system that can simulate the various conditions and monitor the Device Under Test (DUT) to assist in determining the root cause. The customer turned to DISTek to provide a bench-top setup that will control the DUT and measure multiple in-circuit test points for events that may be damaging field effect transistors (FET) along with recording FET case temperatures. Custom events have been defined by the customer and will trigger the system to capture pre and post-trigger data. The test system should also provide various loads to the output of the DUT.