CHALLENGE A major motorcycle manufacturer determined they needed to increase the efficiency of their testing. They were incurring rework with countless failed tests of their new antilock brake & traction …
A customer has been receiving field failures and the root cause has been difficult to determine. They have ideas of what may be causing these failures and need a test system that can simulate the various conditions and monitor the Device Under Test (DUT) to assist in determining the root cause. The customer turned to DISTek to provide a bench-top setup that will control the DUT and measure multiple in-circuit test points for events that may be damaging field effect transistors (FET) along with recording FET case temperatures. Custom events have been defined by the customer and will trigger the system to capture pre and post-trigger data. The test system should also provide various loads to the output of the DUT.
With the ever increasing demands of the economy and to show a good return on investment, companies are continually looking for ways to cut back on spending. Unfortunately, one area that can easily end up being targeted for cost reduction is testing.
If you have lots of data or find yourself doing repetitive tasks with small sets of data, then you might want to consider NI DIAdem software to navigate, view, analyze, and report your data.
More new hardware was introduced including a small Real-Time/FPGA target called the NI System on Module. () The NI System on Module (SOM) combines the Xilinx Zynq FPGA, common components like memory, and a complete middleware solution, delivering a complete embedded platform that minimizes design time and risk for any embedded control or monitoring application. The NI SOM also ships with NI Linux Real-Time, which combines the performance of a real-time operating system with the openness of Linux. Along with a vast community, Linux allows the freedom to choose how you program the processor, using either LabVIEW system design software or C/C++ with Eclipse.
The new AEF ISOBUS Conformance Test was officially unveiled in September 2013. It is closely tied to the AEF concepts of ISOBUS Functionalities and the AEF Database. These 3 new concepts were created to address a lack of clarity with the previous AEF certification from DLG. The DLG stamp of approval indicated that a device was ISOBUS certified, but it only tested for the Virtual Terminal capability and gave no indication about other capabilities.
Last week I attended the NI Architect Summit, and I saw some patterns emerge while sitting in on the frameworks track. All of the framework content was related to challenges in LabVIEW Object Oriented Programming (LVOOP). LabVIEW is sold as a software tool for scientists and engineers, yet also provides features including LVOOP for advanced users. The takeaways below speak to the challenge of transitioning from a procedural single-threaded dataflow design to a parallel messaging architecture using LVOOP.
